3D Microelectronic Packaging: From Fundamentals to by Yan Li, Deepak Goyal

By Yan Li, Deepak Goyal

This quantity offers a entire reference for graduate scholars and execs in either academia and at the basics, processing information, and functions of 3D microelectronic packaging, an pattern for destiny microelectronic applications. Chapters written by means of specialists hide the newest study effects and development within the following parts: TSV, die processing, micro bumps, direct bonding, thermal compression bonding, complex fabrics, warmth dissipation, thermal administration, thermal mechanical modeling, caliber, reliability, fault isolation, and failure research of 3D microelectronic applications. a number of photos, tables, and didactic schematics are integrated all through. This crucial quantity equips readers with an in-depth knowing of all facets of 3D packaging, together with packaging structure, processing, thermal mechanical and moisture comparable reliability issues, universal disasters, constructing parts, and destiny demanding situations, supplying insights into key components for destiny study and improvement.

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3D Microelectronic Packaging: From Fundamentals to Applications

This quantity offers a complete reference for graduate scholars and execs in either academia and at the basics, processing information, and purposes of 3D microelectronic packaging, an development for destiny microelectronic programs. Chapters written by way of specialists hide the newest examine effects and growth within the following parts: TSV, die processing, micro bumps, direct bonding, thermal compression bonding, complicated fabrics, warmth dissipation, thermal administration, thermal mechanical modeling, caliber, reliability, fault isolation, and failure research of 3D microelectronic programs.

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Process, materials, and design parameters for each assembly step, and the impact to upstream and downstream steps of the process are carefully studied and optimized for maximal yield. (b) Ensuring each key component “Known Good” If only known good components are assembled, the chances that the overall module will perform as intended is significantly increased. Components and subassemblies need to be fully tested prior to assembly to ensure that they are known good11 and cause no yield loss when modules are tested.

In summary, the power efficiency advantage due to short TSV interconnects must be balanced against the disadvantages in TDP reduction and increased chip area due to the TSV integration. A designer must ensure that the disadvantages don’t adversely affect the overall performance or value of the product being designed. 3 Methods of Fabrication and Other TSV Attributes The structure and location of a TSV with reference to the transistors and back-end interconnect stack in a typical wafer is shown schematically in Fig.

The test results are stored in a database that tracks each wafer, and die indexed by its position on the wafer. For SiP Modules, Sort is expected to deliver Known Good Die to the assembly process. (c) Burn-In—The function of Burn-In is to accelerate the failure of latent defects (such as fab and assembly process-induced defects or design marginalities) in an assembled SiP unit to become detectable at a Test step. ” By removing these units, product failures observed by customers are limited to “wearout” mechanisms which occur far in the future.

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